| Title |
Power
Consumption of Fault Tolerance codes: the active elements |
| Author(s) |
D. Rossi, V.E.S van Dijk, R.P.
Kleihorst, A.K. Nieuwland, C. Metra |
| Event |
IOLTS 2003, Kos, Greece, proceedings
pp.61-67. |
| Date |
July 2003 |
| |
|
| Title |
Crosstalk
effect minimization for encoded buses |
| Author(s) |
L. Di Silvio, D. Rossi, C. Metra |
| Event |
IOLTS 2003, Kos, Greece, proceedings pp.
214-218 |
| Date |
July 2003 |
| |
|
| Title |
Positive
effect on IC yield of embedded fault tolerance for SEU's |
| Author(s) |
A.K. Nieuwland, R.P. Kleihorst |
| Event |
IOLTS 2003, Kos, Greece, proceedings
pp.75-79 |
| Date |
July 2003 |
| |
|
| Title |
Error
Correcting Codes for Crosstalk Effect Minimization |
| Author(s) |
D. Rossi, S. Cavallotti, C. Metra |
| Event |
Proceedings of IEEE International
Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03),
pp. 257-264, Boston, MA, 3-5 |
| Date |
November 2003 |
| |
|
| Title |
Why
Transition Coding for power minimization of On-Chip Buses does not
work |
| Author(s) |
C. Kretzschmar, A.K. Nieuwland, D.
Müller |
| Event |
Design, Automation, and Test in Europe
(DATE'04), pp. 512-517, Paris, France |
| Date |
February 2004 |
| |
|
| Title |
Impact
of ECCs on Simultaneously Switching Output Noise for On-Chip Busses
of High Reliability Systems |
| Author(s) |
D. Rossi, A. Muccio, A.K. Nieuwland, A.
Katoch and C. Metra |
| Event |
To appear in Proceedings of International
On-Line Testing Symposium (IOLTS'04), Madeira, Portugal |
| Date |
12-14 July 2004 |
| |
|
| Title |
Reducing
cross-talk induced power consumption and delay |
| Author(s) |
A.K. Nieuwland, A. Katoch and M. Meijer |
| Event |
To appear in Proceedings of the fourteenth
International Workshop on Power and Timing Modeling, Optimization
and Simulation (PATMOS '04), Santorini, Greece |
| Date |
15-17 September 2004 |
